The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 03, 2023
Filed:
Jun. 17, 2021
Qualcomm Incorporated, San Diego, CA (US);
Huilin Xu, Temecula, CA (US);
Umesh Phuyal, San Diego, CA (US);
Lei Xiao, San Jose, CA (US);
Jing Lei, San Diego, CA (US);
Qunfeng He, San Diego, CA (US);
Xipeng Zhu, San Diego, CA (US);
QUALCOMM Incorporated, San Diego, CA (US);
Abstract
Methods, systems, and devices for wireless communications are described. Generally, the described techniques provide for measuring, filtering, and reporting cross-link interference (CLI) in cases where not all aggressor user equipments (UEs) are transmitting signals that can be measured by a victim UE. A UE may obtain a set of CLI measurements by performing CLI measurements during a set of CLI measurement occasions. The UE may determine a first subset of the set of CLI measurements that satisfy a CLI measurement threshold and a second subset of the set of CLI measurements that do not satisfy the CLI measurement threshold. The UE may apply a filter to the first subset of the set of CLI measurements, and suppress the filter for the second subset of the set of CLI measurements, to obtain a filtered CLI measurement value. The UE may transmit the filtered CLI measurement value to a base station.