The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 03, 2023

Filed:

May. 19, 2020
Applicant:

Zte Corporation, Guangdong, CN;

Inventors:

Yongsheng Du, Guangdong, CN;

Yingyan Luo, Guangdong, CN;

Chunjin Pan, Guangdong, CN;

Assignee:

ZTE CORPORATION, Guangdong, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 43/0817 (2022.01); G06F 18/214 (2023.01); G06F 18/21 (2023.01); H04L 9/40 (2022.01);
U.S. Cl.
CPC ...
H04L 43/0817 (2013.01); G06F 18/214 (2023.01); G06F 18/2178 (2023.01); H04L 63/1425 (2013.01);
Abstract

Disclosed in embodiments of the present disclosure are an anomaly detection method and apparatus. The method includes: detecting first feature data of collected first data using each anomaly detection algorithm, respectively, where N is an integer greater than or equal to 1; in response to first detection results corresponding to one or more anomaly detection algorithms being abnormal, performing reliability verification on the first feature data of the first data to obtain first verification results; and determining second detection results according to the first verification results and according to whether reliability of the one or more anomaly detection algorithms is greater than or equal to a first preset threshold.


Find Patent Forward Citations

Du, Yongsheng. (2023). Anomaly detection method and apparatus (U.S. Patent No. 11777824). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11777824

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