The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 03, 2023
Filed:
Feb. 05, 2021
Ciena Corporation, Hanover, MD (US);
Robert Kevin Tomkins, Ottawa, CA;
Shelley A. Bhalla, Morrisville, NC (US);
Emil Janulewicz, Ottawa, CA;
Ciena Corporation, Hanover, MD (US);
Abstract
Systems and methods include obtaining overlay telemetry data from a plurality of overlays, wherein each overlay is an application and there is a corresponding telemetry adaptor for each overlay; obtaining underlay telemetry data from one or more underlays, wherein each underlay includes physical infrastructure for supporting one or more of network, compute, and store functions for the plurality of overlays; analyzing the overlay telemetry data and the underlay telemetry data via a Key Performance Factor (KPF) model that correlates one or more of the plurality of overlays and the one or more underlays together; responsive to an anomaly or a threshold crossing based on the KPF model, performing a Root Cause Analysis (RCA) to identify a root cause of the anomaly or the threshold crossing; and mapping one or more actions with associated priorities to the root cause utilizing one or more remediation modules each associated with an overlay.