The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 03, 2023

Filed:

Feb. 09, 2021
Applicant:

Telefonaktiebolaget Lm Ericsson (Publ), Stockholm, SE;

Inventors:

Magnus Nilsson, Lund, SE;

Peter Jakobsson, Lund, SE;

Per Ingelhag, Alingsås, SE;

Sten Wallin, Enskede, SE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 17/14 (2015.01); H04B 17/21 (2015.01);
U.S. Cl.
CPC ...
H04B 17/14 (2015.01); H04B 17/21 (2015.01);
Abstract

Methods for determining calibration parameters to correct for frequency responses of one or more dielectric waveguides coupling a control unit to a first antenna node or to a series of antenna nodes that includes the first antenna node. An example method comprises transmitting, via a first dielectric waveguide coupling the control unit to the first antenna node, a radiofrequency (RF) test signal having a signal bandwidth covering a bandwidth of interest. The method further comprises receiving, via a second dielectric waveguide coupling the control unit to the first antenna node, a looped-back version of the transmitted RF test signal, and estimating a first one-way frequency response corresponding to the first (or second) dielectric waveguide, based on the RF test signal and the received loop-back version of the transmitted RF test signal.


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