The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 03, 2023
Filed:
Nov. 03, 2021
Shimadzu Corporation, Kyoto, JP;
Shinichi Yamaguchi, Kyoto, JP;
SHIMADZU CORPORATION, Kyoto, JP;
Abstract
An analysis operator checks an optical microscopic image obtained with an imaging mass microscope and indicates a color characteristic of an area which the analysis operator is focusing on. An optical microscopic image feature extractor calculates luminance distribution data in the indicated color. An image position adjustment processor performs a position adjustment process on a luminance distribution image derived from the optical microscopic image and an MS imaging graphic, while a resolution adjuster equalizes their spatial resolutions. A statistical analysis processor calculates a coefficient of spatial correlation between the luminance distribution image and the MS imaging graphic for each mass-to-charge ratio. Based on the calculated correlation coefficients, an analysis result display processor extracts a mass-to-charge ratio which shows an ion intensity distribution similar to the luminance distribution image. and displays it on a display unit.