The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 03, 2023

Filed:

Oct. 15, 2021
Applicant:

Nec Corporation, Tokyo, JP;

Inventor:

Tatsuya Shimahara, Tokyo, JP;

Assignee:

NEC CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06V 40/12 (2022.01); G06V 10/771 (2022.01);
U.S. Cl.
CPC ...
G06V 40/1353 (2022.01); G06V 10/771 (2022.01); G06V 40/1347 (2022.01); G06V 40/1365 (2022.01);
Abstract

A biometric recognition apparatus and fingerprint feature extraction method can automatically optimize parameters used for extracting a feature template from a biometric image. The biometric recognition apparatus includes: a teacher data generation unit that generates a genuine pair and an imposter pair of first and second biometric images; a learning data generation unit that uses a plurality of different temporary parameters to extract feature templates from the first biometric image and the second biometric image; and an optimum solution determination unit that calculates a score separation degree on the temporary parameter basis based on a first score representing a similarity degree of a pair of the feature templates extracted from the genuine pair and a second score representing a similarity degree of a pair of the feature templates extracted from the imposter pair and determines the temporary parameter based on a level of the score separation degree.


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