The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 03, 2023

Filed:

Jul. 26, 2019
Applicant:

Shenzhen University, Guangdong, CN;

Inventors:

Xiaoli Liu, Guangdong, CN;

Yifan Liao, Guangdong, CN;

Hailong Chen, Guangdong, CN;

Xiang Peng, Guangdong, CN;

Qijian Tang, Guangdong, CN;

Assignee:

SHENZHEN UNIVERSITY, Guangdong, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 19/00 (2011.01); G06T 7/70 (2017.01); H04N 13/221 (2018.01); H04N 13/275 (2018.01); H04N 13/282 (2018.01); G06T 17/00 (2006.01); G06T 7/80 (2017.01);
U.S. Cl.
CPC ...
G06T 19/00 (2013.01); G06T 7/70 (2017.01); G06T 7/85 (2017.01); G06T 17/00 (2013.01); H04N 13/221 (2018.05); H04N 13/275 (2018.05); H04N 13/282 (2018.05); G06T 2207/30244 (2013.01); G06T 2210/12 (2013.01);
Abstract

Disclosed in the embodiments of the present disclosure are a method for planning three-dimensional scanning viewpoint, a device for planning three-dimensional scanning viewpoint and a computer readable storage medium. After a low-precision digitalized model of an object to be scanned is acquired, viewpoint planning calculation is performed, on the basis of a viewpoint planning algorithm, on point cloud data in the low-precision digitalized model, and then the positions and line-of-sight directions of a plurality of viewpoints in space are calculated when a three-dimensional sensor needs to perform three-dimensional scanning on said object. Calculating viewpoints of a three-dimensional sensor by means of a viewpoint planning algorithm can effectively improve the accuracy and scientific nature of sensor posture determination, greatly improving the efficiency of viewpoint planning, and reducing the time consumed in the whole three-dimensional measurement process.


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