The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 03, 2023
Filed:
Mar. 28, 2019
Nec Corporation, Tokyo, JP;
Zhenwei Wang, Tokyo, JP;
NEC CORPORATION, Tokyo, JP;
Abstract
A measurement information acquisition unit acquires depth information indicating a depth in a detection range measured by a depth measurement device that measures the depth. An image acquisition unit acquires an image of the detection range captured by an imaging device that captures the image. A depth extraction unit extracts partial depth information in which a portion not being subject to a determination of being foreign matter or not is removed from the depth information, based on the acquired image. A foreign matter determination unit determines presence or absence of foreign matter in the detection range based on the partial depth information.
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