The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 03, 2023

Filed:

Jul. 08, 2020
Applicant:

University of Florida Research Foundation, Incorporated, Gainesville, FL (US);

Inventors:

Damon Woodard, Newberry, FL (US);

Navid Asadizanjani, Gainesville, FL (US);

Domenic J. Forte, Gainesville, FL (US);

Ronald Wilson, Gainesville, FL (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 5/00 (2006.01); H04N 19/93 (2014.01);
U.S. Cl.
CPC ...
G06T 5/003 (2013.01); H04N 19/93 (2014.11);
Abstract

Systems and methods are configured to generate a frequency map representing a density of objects found in regions of a sample that may be used in setting parameters for imaging the regions. Various embodiments involve binarizing the pixels for a raw image of the sample to transform the image into binary data. Run-length encoded components are identified from the data for dimensions of the raw image. Each component is a length of a sequence of adjacent pixels found in a dimension with the same value in the binary data. A projection of the image is then generated from projection values for the dimensions. Each projection value provides a measure of the density of objects present in a dimension with respect to the components identified for the dimension. This projection is used to identify a level of density for each region of the sample from which the frequency map is generated.


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