The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 03, 2023
Filed:
Nov. 10, 2021
Sas Institute Inc., Cary, NC (US);
Yan Gao, Cary, NC (US);
Joshua David Griffin, Harrisburg, NC (US);
Yu-Min Lin, Raleigh, NC (US);
Bengt Wisen Pederson, Durham, NC (US);
Ricky Dee Tharrington, Jr., Raleigh, NC (US);
Pei-Yi Tan, New Smyrna Beach, FL (US);
Raymond Eugene Wright, Cary, NC (US);
SAS Institute Inc., Cary, NC (US);
Abstract
A computing device selects new test configurations for testing software. Software under test is executed with first test configurations to generate a test result for each test configuration. Each test configuration includes a value for each test parameter where each test parameter is an input to the software under test. A predictive model is trained using each test configuration of the first test configurations in association with the test result generated for each test configuration based on an objective function value. The predictive model is executed with second test configurations to predict the test result for each test configuration of the second test configurations. Test configurations are selected from the second test configurations based on the predicted test results to define third test configurations. The software under test is executed with the defined third test configurations to generate the test result for each test configuration of the third test configurations.