The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 03, 2023

Filed:

Dec. 06, 2021
Applicant:

University of Florida Research Foundation, Inc., Gainesville, FL (US);

Inventors:

Prabhat Kumar Mishra, Gainesville, FL (US);

Jennifer Marie Sheldon, Gainesville, FL (US);

Zhixin Pan, Gainesville, FL (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 21/76 (2013.01); G06F 21/54 (2013.01); G06F 30/333 (2020.01); G06F 21/55 (2013.01); G06N 3/08 (2023.01);
U.S. Cl.
CPC ...
G06F 21/76 (2013.01); G06F 21/54 (2013.01); G06F 21/554 (2013.01); G06F 21/556 (2013.01); G06F 30/333 (2020.01); G06N 3/08 (2013.01);
Abstract

The present disclosure describes systems and methods for test pattern generation to detect a hardware Trojan using delay-based analysis. One such method comprises determining a set of initial test patterns to activate the hardware Trojan within an integrated circuit design; and generating a set of succeeding test patterns to activate the hardware Trojan within the integrated circuit design using a reinforcement learning model. The set of initial test patterns can be applied as an input to the reinforcement learning model. Further, the reinforcement learning model can be trained with a stochastic learning scheme to increase a probability of triggering one or more rare nodes in the integrated circuit design and identify optimal test vectors to maximize delay-based side-channel sensitivity when the hardware Trojan is activated in the integrated circuit design. Other methods and systems are also provided.


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