logo

For the Inventor, By the Inventor

The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 11775654 B1

PDFFull Text
Date of Patent:
Oct. 03, 2023

Filed:

Dec. 14, 2020

Anomaly detection with impact assessment

Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Yuk L. Chan, Rochester, NY (US);

Anuja Deedwaniya, Poughkeepsie, NY (US);

Robert M. Abrams, Wappinger Falls, NY (US);

Assignee:

International Business Machines Corporation, Armonk, NY (US);

Attorneys:

CANTOR COLBURN LLP

Teddi Maranzano

Primary Examiner:

Jeffrey C Pwu

Assistant Examiner:

Thong P Truong

Int. Cl.
CPC ...
G06F 21/00 (2013.01); G06F 21/57 (2013.01); G06F 16/901 (2019.01); G06F 9/48 (2006.01);
U.S. Cl.
CPC ...
G06F 21/577 (2013.01); G06F 9/4881 (2013.01); G06F 16/9024 (2019.01);
Abstract

Examples described herein provide a computer-implemented method that includes detecting an anomaly associated with an object of a computer system and determining an importance classification of the object. An object relationship of the object is determined with respect to one or more other objects of the computer system. An impact score of the anomaly is determined based on the importance classification and the object relationship. An anomaly report is output with the impact score.

Find Patent Forward Citations

Quick Actions:

Chan, Yuk. (2023). Anomaly detection with impact assessment (U.S. Patent No. 11775654). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11775654

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…