The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 03, 2023
Filed:
Jun. 27, 2018
International Business Machines Corporation, Armonk, NY (US);
Frederico Araujo, White Plains, NY (US);
Anne E. Kohlbrenner, Pittsburgh, PA (US);
Marc Philippe Stoecklin, White Plains, NY (US);
Teryl Paul Taylor, Danbury, CT (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A stackable filesystem that transparently tracks process file writes for forensic analysis. The filesystem comprises a base filesystem, and an overlay filesystem. Processes see the union of the upper and lower filesystems, but process writes are only reflected in the overlay. By providing per-process views of the filesystem using this stackable approach, a forensic analyzer can record a process's file-based activity—i.e., file creation, deletion, modification. These activities are then analyzed to identify indicators of compromise (IoCs). These indicators are then fed into a forensics analysis engine, which then quickly decides whether a subject (e.g., process, user) is malicious. If so, the system takes some proactive action to alert a proper authority, to quarantine the potential attack, or to provide other remediation. The approach enables forensic analysis without requiring file access mediation, or conducting system event-level collection and analysis, making it a lightweight, and non-intrusive solution.