The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 03, 2023

Filed:

Mar. 11, 2020
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Jun Fang, Santa Clara, CA (US);

Joseph H. Hassoun, Los Gatos, CA (US);

Ali Shafiee Ardestani, San Jose, CA (US);

Hamzah Ahmed Ali Abdelaziz, San Jose, CA (US);

Georgios Georgiadis, Porter Ranch, CA (US);

Hui Chen, Irvine, CA (US);

David Philip Lloyd Thorsley, Morgan Hill, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/18 (2006.01); G06N 3/02 (2006.01); G06N 3/04 (2023.01); G06N 3/08 (2023.01);
U.S. Cl.
CPC ...
G06F 17/18 (2013.01); G06N 3/02 (2013.01); G06N 3/04 (2013.01); G06N 3/08 (2013.01);
Abstract

In some embodiments, a method of quantizing an artificial neural network includes dividing a quantization range for a tensor of the artificial neural network into a first region and a second region, and quantizing values of the tensor in the first region separately from values of the tensor in the second region. In some embodiments, linear or nonlinear quantization are applied to values of the tensor in the first region and the second region. In some embodiments, the method includes locating a breakpoint between the first region and the second region by substantially minimizing an expected quantization error over at least a portion of the quantization range. In some embodiments, the expected quantization error is minimized by solving analytically and/or searching numerically.


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