The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 03, 2023

Filed:

Jul. 07, 2022
Applicant:

Massachusetts Institute of Technology, Cambridge, MA (US);

Inventors:

Devavrat D. Shah, Waban, MA (US);

Anish Agarwal, Newton, MA (US);

Muhammad Amjad, Cambridge, MA (US);

Dennis Shen, Irvine, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/16 (2006.01); G06F 17/18 (2006.01); G06N 7/01 (2023.01); G01D 1/14 (2006.01); G01D 1/02 (2006.01);
U.S. Cl.
CPC ...
G06F 17/16 (2013.01); G06F 17/18 (2013.01); G06N 7/01 (2023.01); G01D 1/02 (2013.01); G01D 1/14 (2013.01); G05B 2219/37524 (2013.01);
Abstract

A system and method model a time series from missing data by imputing missing values, denoising measured but noisy values, and forecasting future values of a single time series. A time series of potentially noisy, partially-measured values of a physical process is represented as a non-overlapping matrix. For several classes of common model functions, it can be proved that the resulting matrix has a low rank or approximately low rank, allowing a matrix estimation technique, for example singular value thresholding, to be efficiently applied. Applying such a technique produces a mean matrix that estimates latent values, of the physical process at times or intervals corresponding to measurements, with less error than previously known methods. These latent values have been denoised (if noisy) and imputed (if missing). Linear regression of the estimated latent values permits forecasting with an error that decreases as more measurements are made.


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