The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 03, 2023

Filed:

Aug. 31, 2021
Applicant:

Kabushiki Kaisha Toshiba, Tokyo, JP;

Inventors:

Wataru Watanabe, Tokyo, JP;

Takayuki Itoh, Kanagawa, JP;

Jumpei Ando, Kanagawa, JP;

Keisuke Kawauchi, Kanagawa, JP;

Toshiyuki Ono, Kanagawa, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/242 (2019.01); G06F 16/22 (2019.01); G06F 16/26 (2019.01); G06F 18/24 (2023.01); G06F 18/21 (2023.01);
U.S. Cl.
CPC ...
G06F 16/2445 (2019.01); G06F 16/2228 (2019.01); G06F 16/26 (2019.01); G06F 18/2193 (2023.01); G06F 18/24 (2023.01);
Abstract

According to one embodiment, a data analysis apparatus includes a processor. The processor acquires, for a plurality of products as analysis targets, manufacturing data including at least one manufacturing condition for each product. The processor calculates, based on a bias of state data representing a degree that the product is in a specific state in at least one item that can be taken concerning one manufacturing condition extracted from the manufacturing data, an index value representing a degree that a cause of the specific state of the product is the manufacturing condition.


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