The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 03, 2023

Filed:

Dec. 29, 2020
Applicant:

Dell Products L.p., Round Rock, TX (US);

Inventors:

Weilan Pu, Chengdu, CN;

Jian Kang, Chengdu, CN;

Chi Chen, Chengdu, CN;

Wen Chen, Chengdu, CN;

Assignee:

Dell Products L.P., Round Rock, TX (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 16/00 (2019.01); G06F 16/174 (2019.01); G06F 16/28 (2019.01);
U.S. Cl.
CPC ...
G06F 16/1748 (2019.01); G06F 16/285 (2019.01);
Abstract

An apparatus comprises at least one processing device configured to collect, from a plurality of storage systems, data patterns for data stored in the plurality of storage systems and to cluster the plurality of storage systems into one or more data pattern sharing clusters based at least in part on the collected data patterns, a given one of the one or more data pattern sharing clusters comprising two or more of the plurality of storage systems. The at least one processing device is also configured to identify, for the given data pattern sharing cluster, a subset of the collected data patterns and to provide, to the two or more storage systems of the given data pattern sharing cluster, the identified subset of the data patterns, wherein the identified subset of the collected data patterns are utilized by the two or more storage systems in performing data deduplication.


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