The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 03, 2023
Filed:
Mar. 19, 2021
Hewlett Packard Enterprise Development Lp, Houston, TX (US);
Sergey Serebryakov, Milpitas, CA (US);
Tahir Cader, Liberty Lake, WA (US);
Deepak Nanjundaiah, Bangalore, IN;
Hewlett Packard Enterprise Development LP, Spring, TX (US);
Abstract
Multi-metric artificial intelligence (AI)/machine learning (ML) models for detection of anomalous behavior of a machine/system are disclosed. The multi-metric AI/ML models are configured to detect anomalous behavior of systems having multiple sensors that measure correlated sensor metrics such as coolant distribution units (CDUs). The multi-metric AI/ML models perform the anomalous system behavior detection in a manner that enables both a reduction in the amount of sensor instrumentation needed to monitor the system's operational behavior as well as a corresponding reduction in the complexity of the firmware that controls the sensor instrumentation. As such, AI-enabled systems and corresponding methods for anomalous behavior detection disclosed herein offer a technical solution to the technical problem of increased failure rates of existing multi-sensor systems, which is caused by the presence of redundant sensor instrumentation that necessitates complex firmware for controlling the sensor instrumentation.