The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 03, 2023
Filed:
Oct. 16, 2020
Agc Inc., Tokyo, JP;
Yukihiro Tao, Tokyo, JP;
Naruki Yamada, Tokyo, JP;
Osamu Iwata, Tokyo, JP;
Yoshinori Iguchi, Tokyo, JP;
Yusuke Sato, Tokyo, JP;
Yoko Mitsui, Tokyo, JP;
Tsuneo Ichimatsu, Tokyo, JP;
AGC Inc., Tokyo, JP;
Abstract
There are provided a video projecting structure, which is capable of having not only transparency but also high visibility of a video, a process for producing the same, and a video display system including the video projection structure. A video projecting structure includes a first transparent layer having irregularities disposed on a surface thereof, a reflective layer disposed on the surface of the first transparent layer, and a second transparent layer disposed on the reflective layer; wherein when a surface of the first transparent layer opposite to the reflective layer is defined as a reference surface, the irregularities include a plurality of slant surfaces slant to the reference surface and reflecting light from a video; wherein when a first direction, a second direction and a third direction are defined such that the first direction is perpendicular to a normal direction of the reference surface, the slant surfaces extend in the first direction, the second direction is orthogonal to the first direction, the slant surfaces are arrayed in the second direction, and the third direction is a direction in which the slant surfaces have an average slant angle θ to the reference surface in section in the second direction; the irregularities include a portion which is configured such that when an average spacing Smof the irregularities in the first direction, an average spacing Smof the irregularities in the second direction and an average spacing Smof the irregularities in the third direction are such that Sm>Smand Sm>Smare met, and Smis maximum; and wherein the irregularities include a portion which is configured such that when a frequency distribution of inclinations of the irregularities in the second direction to the reference surface is measured in 0.25° divisions in every distance of 1 mm in order that the frequencies are represented as distances, the absolute value of a median value in the frequency distribution is a value other than 0°.