The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 03, 2023
Filed:
Sep. 25, 2022
Asahi Kasei Microdevices Corporation, Tokyo, JP;
Shigeki Okatake, Tokyo, JP;
Makoto Kataoka, Tokyo, JP;
Takenobu Nakamura, Tokyo, JP;
Seiichi Kato, Tokyo, JP;
Asahi Kasei Microdevices Corporation, Tokyo, JP;
Abstract
Provided is a magnetic field measuring apparatus for: acquiring the measurement data measured by a magnetic sensor array that is configured by arraying the plurality of magnetic sensor cells to form a surface covering at least a part of a target object to be measured; performing signal separation on a magnetic field spatial distribution indicated by the measurement data based on a position and magnetic sensitivity of each magnetic sensor; generating a calibration magnetic field at a position on a straight line that can be drawn without crossing the plurality of magnetic sensor cells from the measurement space outside the measurement space; and calibrating a sensor error for the magnetic sensor based on a separation error in a case where signal separation has been performed on a spatial distribution of the calibration magnetic field.