The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 03, 2023

Filed:

Jan. 17, 2019
Applicant:

Xcerra Corporation, Norwood, MA (US);

Inventors:

Stefan Weiss, Wertheim, DE;

Oleh Yuschuk, Wertheim-Reicholzheim, DE;

Christian Weindel, Ölbronn-Dürm, DE;

Assignee:

ATG LUTHER & MAELZER GMBH, Wertheim/Reicholzhei, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/312 (2006.01); G01R 31/28 (2006.01); G01R 1/067 (2006.01); G01R 1/07 (2006.01);
U.S. Cl.
CPC ...
G01R 31/312 (2013.01); G01R 1/06738 (2013.01); G01R 1/07 (2013.01); G01R 31/2813 (2013.01);
Abstract

The invention relates to a test needle for measuring electrically conductive layers in holes of printed circuit boards, as well as to a test probe equipped with such a test needle and to a flying probe tester for testing printed circuit boards equipped with such a test needle or such a test probe. The test needle has a capacitive measuring body, which is connected via a cable to a capacitive measuring device. The cable is shielded so that only the capacitive measuring body can form a capacitive coupling with other electrically conductive bodies. This makes it possible to determine this capacitive coupling with a high local resolution.


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