The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 03, 2023

Filed:

Apr. 29, 2020
Applicants:

Bluetest Ab, Gothenburg, SE;

Gefle Testteknik Ab, Gävle, SE;

Inventors:

Peder Malmlöf, Gävle, SE;

Robert Rehammar, Romelanda, SE;

Assignees:

BLUETEST AB, Gothenburg, SE;

GEFLE TESTTEKNIK AB, Gävle, SE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 27/04 (2006.01); G01R 29/10 (2006.01); H04B 17/29 (2015.01); H04B 17/391 (2015.01); H04L 1/20 (2006.01);
U.S. Cl.
CPC ...
G01R 29/105 (2013.01); H04B 17/29 (2015.01); H04B 17/3911 (2015.01); H04L 1/203 (2013.01);
Abstract

A method for measuring performance of at least one DUT in a reverberation chamber over a frequency band, the method including, iteratively: generating a fading scenario by the reverberation chamber; identifying at least one measurement sub-band included in the frequency band, wherein the at least one measurement sub-band complies with a gain flatness criterion; measuring performance of the at least one DUT in the at least one identified measurement sub-band, thereby generating at least one performance measurement result; accumulating the at least one performance measurement result; and determining measurement coverage and terminating the performance measurement in case the measurement coverage meets a coverage criterion.


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