The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 03, 2023

Filed:

Jul. 10, 2020
Applicant:

Endress+hauser Se+co. KG, Maulburg, DE;

Inventor:

Thomas Blödt, Steinen, DE;

Assignee:

Endress+Hauser SE+Co. KG, Maulburg, DE;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01F 23/292 (2006.01); G01R 27/26 (2006.01);
U.S. Cl.
CPC ...
G01R 27/2682 (2013.01); G01F 23/292 (2013.01);
Abstract

The invention relates to a measuring device for determining the dielectric value of a medium. The measuring device is based on two waveguides, each of which has a signal gate on one end. The waveguides are, in such case, so arranged that the signal gates lie opposite one another. Formed therebetween is a sample space for the medium, such that a high frequency signal, which is in-coupled into the first waveguide, is transmitted into the second waveguide via the second signal gate after passage through the medium. Since the transmitted fraction and the reflected fraction of the high frequency signal depend strongly on the dielectric value, such can, as a result, be measured with a high sensitivity and, depending on choice of the frequency band and dimensioning of the waveguides, over a large value range.


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