The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 03, 2023

Filed:

Mar. 27, 2020
Applicant:

Apple Inc., Cupertino, CA (US);

Inventors:

Mehmet Mutlu, Stanford, CA (US);

Miaolei Yan, Santa Clara, CA (US);

Michael K. Brown, Sunnyvale, CA (US);

Richard Yeh, Cupertino, CA (US);

Assignee:

Apple Inc., Cupertino, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 15/14 (2006.01); G01N 15/06 (2006.01); G01S 7/4912 (2020.01); G01P 5/26 (2006.01); G01P 5/00 (2006.01); G01P 5/20 (2006.01);
U.S. Cl.
CPC ...
G01N 15/1434 (2013.01); G01N 15/06 (2013.01); G01P 5/001 (2013.01); G01P 5/20 (2013.01); G01P 5/26 (2013.01); G01S 7/4916 (2013.01); G01N 2015/0693 (2013.01); G01N 2015/1454 (2013.01);
Abstract

Various sensors, including particulate matter sensors, are described. One particulate matter sensor includes a self-mixing interferometry sensor and a set of one or more optical elements. The set of one or more optical elements is positioned to receive an optical emission of the self-mixing interferometry sensor, split the optical emission into multiple beams, and direct each beam of the multiple beams in a different direction. The self-mixing interferometry sensor is configured to generate particle speed information for particles passing through respective measurement regions of the multiple beams.


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