The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 03, 2023
Filed:
Aug. 25, 2020
Applicant:
Yantai Unversity, Yantai, CN;
Inventors:
Assignee:
Yantai Unversity, Yantai, CN;
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01B 7/06 (2006.01);
U.S. Cl.
CPC ...
G01B 7/06 (2013.01);
Abstract
The present invention discloses a flexible method and apparatus for thickness measurement. The apparatus includes seven parts: a measurement host, an etalon, a tested piece, a test piece positioning support, a driver, and a digital controller. The measurement host includes a rack, a coding lead screw, and a dual-acting cantilever sensor. The coding lead screw includes a micro-metering lead screw and a tri-state encoder. The tri-state encoder includes a fluted disc and four pairs of cantilever sensors. The dual-acting cantilever sensor includes left and right mobile cantilever sensors with a pair of clipping pin. The digital controller contains system measurement software.