The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 03, 2023

Filed:

Apr. 16, 2019
Applicant:

SK Enpulse Co., Ltd., Gyeonggi-do, KR;

Inventors:

Hye Young Heo, Gyeonggi-do, KR;

Jang Won Seo, Busan, KR;

Jong Wook Yun, Gyeonggi-do, KR;

Sunghoon Yun, Gyeonggi-do, KR;

Jaein Ahn, Gyeonggi-do, KR;

Assignee:

SK enpulse Co., Ltd., Gyeonggi-do, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B24D 3/34 (2006.01); B24B 37/24 (2012.01); B24B 37/22 (2012.01); B24D 3/28 (2006.01); B24D 11/00 (2006.01); C08J 9/32 (2006.01); H01L 21/304 (2006.01);
U.S. Cl.
CPC ...
B24D 3/348 (2013.01); B24B 37/22 (2013.01); B24B 37/24 (2013.01); B24D 3/28 (2013.01); B24D 11/005 (2013.01); C08J 9/32 (2013.01); C08J 2203/22 (2013.01); C08J 2205/044 (2013.01); C08J 2205/048 (2013.01); C08J 2207/00 (2013.01); C08J 2375/04 (2013.01); H01L 21/304 (2013.01); H01L 2924/069 (2013.01);
Abstract

Embodiments relate to a porous polishing pad for use in a chemical mechanical planarization (CMP) process of semiconductors and a process for preparing the same. According to the embodiments, the size and distribution of the plurality of pores contained in the porous polishing pad can be adjusted in light of the volume thereof. Thus, the plurality of pores have an apparent volume-weighted average pore diameter in a specific range, thereby providing a porous polishing pad that is excellent in such physical properties as polishing rate and the like.


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