The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 03, 2023
Filed:
Jan. 31, 2019
Applicant:
Mitsubishi Hitachi Power Systems, Ltd., Yokohama, JP;
Inventors:
Rei Takei, Tokyo, JP;
Yoshiyuki Doi, Yokohama, JP;
Hiroyuki Katayama, Yokohama, JP;
Toyosei Aota, Yokohama, JP;
Assignee:
MITSUBISHI HEAVY INDUSTRIES, LTD., Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B01D 46/00 (2022.01); B01D 46/42 (2006.01); B01D 46/44 (2006.01); B01D 46/46 (2006.01); B01D 46/56 (2022.01); F02D 25/00 (2006.01); F02C 7/052 (2006.01); G01N 15/08 (2006.01);
U.S. Cl.
CPC ...
B01D 46/56 (2022.01); B01D 46/446 (2013.01); B01D 46/46 (2013.01); F02C 7/052 (2013.01); G01N 15/08 (2013.01); B01D 2279/60 (2013.01); F05D 2260/607 (2013.01); F05D 2270/3015 (2013.01); F05D 2270/3061 (2013.01); F05D 2270/331 (2013.01);
Abstract
The present application relates to a system for quality management of a filter unit disposed in an intake passage. The system includes a plurality of evaluation parameter detection units configured to detect an evaluation parameter relating to of each filter constituting a filter layer of the filter unit. By determining a distribution of the evaluation parameter based on the detection values, the quality evaluation is performed.