The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 03, 2023

Filed:

Jul. 05, 2022
Applicant:

Lumicell, Inc., Newton, MA (US);

Inventors:

David B. Strasfeld, Somerville, MA (US);

W. David Lee, Brookline, MA (US);

Jorge Ferrer, West Newton, MA (US);

Assignee:

Lumicell, Inc., Newton, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 5/00 (2006.01); A61K 49/00 (2006.01); G01N 21/64 (2006.01); G01N 33/483 (2006.01); A61B 90/00 (2016.01);
U.S. Cl.
CPC ...
A61B 5/0071 (2013.01); A61B 5/0082 (2013.01); A61B 5/4848 (2013.01); A61B 5/742 (2013.01); A61K 49/0019 (2013.01); G01N 21/6486 (2013.01); G01N 33/4833 (2013.01); A61B 90/37 (2016.02); A61B 2090/373 (2016.02);
Abstract

Embodiments related to methods of use of an image analysis system for identifying residual cancer cells after surgery are disclosed. In some embodiments, the image analysis system collects a surgical site image and indicates on a display one or more locations of the identified cancer cells. In some embodiments, the method for identifying residual cancer cells comprises determining and selecting a portion of the surgical site image responsive to an intensity parameter; modifying the selected portion of the surgical site image to determine one or more groups of residual cancer cells based on size; and identifying at least one of the one or more groups of residual cancer cells from the modified portion of the surgical site image using a local-based threshold.


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