The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 03, 2023

Filed:

Feb. 24, 2022
Applicant:

Nike, Inc., Beaverton, OR (US);

Inventor:

Bruce J. Kilgore, Lake Oswego, OR (US);

Assignee:

NIKE, Inc., Beaverton, OR (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A43B 23/02 (2006.01); A43B 23/07 (2006.01); A43B 23/00 (2006.01); B29D 35/00 (2010.01);
U.S. Cl.
CPC ...
A43B 23/0235 (2013.01); A43B 23/0245 (2013.01); A43B 23/07 (2013.01); A43B 23/00 (2013.01); B29D 35/00 (2013.01);
Abstract

An article of footwear flat pattern upper () portion () is provided. The upper portion () has a midline reference line () extending between the toe end apex () and a midpoint on the heel end (). The upper portion () also is comprised of an origin () aperture that is located within 10 millimeters of the midline reference line () between the toe end () and the heel end () of the upper portion (). The upper portion () is also formed with an overlay () that is coupled with the upper portion () between the toe end () and the heel end () and between the medial side () and the lateral side (). The overlay () has an alignment aperture () that is aligned with the origin () aperture.


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