The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 26, 2023

Filed:

Jul. 27, 2021
Applicant:

SK Hynix Inc., Gyeonggi-do, KR;

Inventors:

Haobo Wang, San Jose, CA (US);

Aman Bhatia, Los Gatos, CA (US);

Fan Zhang, Fremont, CA (US);

Assignee:

SK hynix Inc., Gyeonggi-do, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 16/34 (2006.01); G11C 16/10 (2006.01); G06N 3/08 (2023.01); G11C 16/26 (2006.01); G06F 7/544 (2006.01);
U.S. Cl.
CPC ...
G11C 16/3404 (2013.01); G06N 3/08 (2013.01); G11C 16/102 (2013.01); G11C 16/26 (2013.01); G06F 7/5443 (2013.01);
Abstract

Embodiments provide a scheme for estimating an optimal read threshold voltage using a deep neural network (DNN) with reduced number of processing. A controller receives first and second program voltage (PV) levels associated with read operations on cells. The controller estimates first and second probability distribution parameter sets representing skew normal distributions of the first and second PV levels, respectively. The controller estimates an optimal read threshold voltage based on the first and second probability distribution parameter sets. The optimal read threshold voltage is a read threshold voltage such that first probability density function (PDF) value of the skew normal distribution of the first PV level is the same as the second PDF value of the skew normal distribution of the second PV level.


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