The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 26, 2023

Filed:

Oct. 23, 2019
Applicant:

Omron Corporation, Kyoto, JP;

Inventors:

Masashi Kurita, Kizugawa, JP;

Yasuyuki Ikeda, Moriyama, JP;

Sakon Yamamoto, Tokyo, JP;

Assignee:

OMRON Corporation, Kyoto, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G06T 3/00 (2006.01); G06T 3/40 (2006.01); G06T 5/00 (2006.01); G06T 5/50 (2006.01); G06T 11/40 (2006.01);
U.S. Cl.
CPC ...
G06T 7/001 (2013.01); G06T 3/0006 (2013.01); G06T 3/40 (2013.01); G06T 5/009 (2013.01); G06T 5/50 (2013.01); G06T 11/40 (2013.01); G06T 2207/20221 (2013.01); G06T 2207/30108 (2013.01);
Abstract

This image processing device, by superimposing a defect imageon a background image, with the original image of an inspection subject as the background image, and performing image processing in which the display format of the defect imageor the display format of the background imageis altered, a plurality of composite imageshaving different ways of seeing the defect imagewith respect to the background imageare generated (step), the advisability of detecting the defect imagefrom each of the plurality of composite imagesis verified (step), the detectable rangeof the defect imageis estimated on the basis of the detection advisability verification results (step), and the detectable rangeis displayed (step).


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