The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 26, 2023
Filed:
Oct. 17, 2022
Uatc, Llc, Mountain View, CA (US);
Raquel Urtasun, Toronto, CA;
Kelvin Ka Wing Wong, Toronto, CA;
Shenlong Wang, Toronto, CA;
Mengye Ren, Toronto, CA;
Ming Liang, Toronto, CA;
UATC, LLC, Mountain View, CA (US);
Abstract
Systems and methods of the present disclosure provide an improved approach for open-set instance segmentation by identifying both known and unknown instances in an environment. For example, a method can include receiving sensor point cloud input data including a plurality of three-dimensional points. The method can include determining a feature embedding and at least one of an instance embedding, class embedding, and/or background embedding for each of the plurality of three-dimensional points. The method can include determining a first subset of points associated with one or more known instances within the environment based on the class embedding and the background embedding associated with each point in the plurality of points. The method can include determining a second subset of points associated with one or more unknown instances within the environment based on the first subset of points. The method can include segmenting the input data into known and unknown instances.