The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 26, 2023
Filed:
Sep. 15, 2020
Microsoft Technology Licensing, Llc, Redmond, WA (US);
Parag Agrawal, Mountain View, CA (US);
Ankan Saha, San Francisco, CA (US);
Yafei Wang, Sunnyvale, CA (US);
Yan Wang, Sunnyvale, CA (US);
Eric Lawrence, Sausalito, CA (US);
Ashwin Narasimha Murthy, Cupertino, CA (US);
Aastha Nigam, Sunnyvale, CA (US);
Bohong Zhao, San Jose, CA (US);
Albert Lingfeng Cui, San Francisco, CA (US);
David Sung, Sunnyvale, CA (US);
Aastha Jain, Sunnyvale, CA (US);
Abdulla Mohammad Al-Qawasmeh, San Francisco, CA (US);
Microsoft Technology Licensing, LLC, Redmond, WA (US);
Abstract
In an example embodiment, a single machine learned model that allows for ranking of entities across all of the different combinations of node types and edge types is provided. The solution calibrates the scores from Edge-FPR models to a single scale. Additionally, the solution may utilize a per-edge type multiplicative factor dictated by the true importance of an edge type, which is learned through a counterfactual experimentation process. The solution may additionally optimize on a single, common downstream metric, specifically downstream interactions that can be compared against each other across all combinations of node types and edge types.