The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 26, 2023

Filed:

Sep. 16, 2020
Applicant:

Nxp B.v., Eindhoven, NL;

Inventors:

Thomas Suwald, Hamburg, DE;

Stefan Maier, Graz, AT;

Assignee:

NXP B.V., Eindhoven, NL;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 21/86 (2013.01); B65D 55/02 (2006.01); G01D 5/24 (2006.01); G01R 27/26 (2006.01); G06K 19/07 (2006.01); G08B 13/24 (2006.01); H01G 5/04 (2006.01);
U.S. Cl.
CPC ...
G06F 21/86 (2013.01); B65D 55/028 (2013.01); G01D 5/24 (2013.01); G01R 27/2605 (2013.01); G06K 19/0716 (2013.01); G08B 13/2468 (2013.01); H01G 5/04 (2013.01); B65D 2401/00 (2020.05);
Abstract

It is described a tamper detection device for detecting tampering with respect to a packaging, the device comprising: i) a first electrode comprising a first patterned structure, and ii) a second electrode comprising a second patterned structure. The first electrode and the second electrode are arranged so that the first patterned structure and the second patterned structure are at least partially opposite to each other. In a first arrangement state of the first patterned structure and the second patterned structure with respect to each other, a first capacitance is measurable, in a second arrangement state of the first patterned structure and the second patterned structure with respect to each other, a second capacitance is measurable, wherein the first capacitance is different from the second capacitance, and wherein the first arrangement state is different from the second arrangement state. The device further comprising: iii) a detection unit, wherein the detection unit is configured to: a) measure the capacitance between the first electrode and the second electrode, b) obtain, based on the measured capacitance, an information indicative of the arrangement state, and c) evaluate, based on the information indicative of the arrangement state, if a tampering with respect to the packaging is detected.


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