The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 26, 2023
Filed:
Mar. 23, 2021
Ebay Inc., San Jose, CA (US);
Hanzhang Wang, San Jose, CA (US);
Huai Jiang, San Jose, CA (US);
Liangfei Su, San Jose, CA (US);
Selcuk Kopru, San Jose, CA (US);
Sanjeev Katariya, San Jose, CA (US);
Wanxue Li, San Jose, CA (US);
eBay Inc., San Jose, CA (US);
Abstract
Process flow graphs are generated from system trace data by obtaining raw distributed trace data for a system, aggregating the raw distributed trace data into aggregated distributed trace data, generating a plurality of process flow graphs from the aggregated distributed trace data, and storing the plurality of process flow graphs in a graphical store. A first critical path can be determined from the plurality of process flow graphs based on an infrastructure design for the system and a process flow graph corresponding to the first critical path provided for graphical display. Certain examples can determine a second critical path involving a selected element of the first critical path and provide the process flow graph for the second critical path for display. Some examples pre-process the aggregated distributed trace data to repair incorrect traces. Other examples merge included process flow graphs into longer graphs.