The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 26, 2023

Filed:

Jan. 27, 2022
Applicant:

Seiko Epson Corporation, Tokyo, JP;

Inventors:

Akira Morita, Chino, JP;

Shinya Ukai, Suwa-gun, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/64 (2020.01); G09G 3/00 (2006.01);
U.S. Cl.
CPC ...
G01R 31/64 (2020.01); G09G 3/006 (2013.01); G09G 2300/0876 (2013.01); G09G 2330/12 (2013.01);
Abstract

An integrated circuit includes a capacitance element to be tested and a test circuit in the same semiconductor substrate, the test circuit includes a capacitance element for testing, and a comparison circuit for comparing a voltage of a node with a voltage of a signal, electrically connects another end of the capacitance element to be tested to the node, applies the voltage of the signal to the node in a first period, changes the voltage of the node based on a capacitance ratio of the capacitance element to be tested and the capacitance element for testing, and tests a capacity size of the capacitance element to be tested based on a comparison result of the comparison circuit in a second period after the first period.


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