The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 26, 2023
Filed:
Aug. 31, 2021
Texas Instruments Incorporated, Dallas, TX (US);
Charles Kasimer Sestok, IV, Dallas, TX (US);
David Patrick Magee, Allen, TX (US);
TEXAS INSTRUMENTS INCORPORATED, Dallas, TX (US);
Abstract
A method includes determining a droop component of a measured parameter of a device under test (DUT). The measured parameter is responsive to an excitation signal having a frequency component, and the droop component is determined responsive to a first value of the parameter at a first time and a second value of the parameter at a second time. The parameter at the first time has a first phase value, and the parameter at the second time has a second phase value. The first phase value is equal to the second phase value. The method also includes correcting a frequency domain representation of the parameter by applying the droop component at a frequency of the representation of the parameter corresponding to the frequency component of the excitation signal.