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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 11768223 B1

PDFFull Text
Date of Patent:
Sep. 26, 2023

Filed:

Jan. 25, 2022

Testing device and probe elements thereof

Applicant:

Tecat Technologies (Suzhou) Limited, Suzhou, CN;

Inventor:

Choon Leong Lou, Suzhou, CN;

Assignee:

TECAT TECHNOLOGIES (SUZHOU) LIMITED, Suzhou, CN;

Attorney:

Li & Cai Intellectual Property (USA) Office

Primary Examiner:

Neel D Shah

Int. Cl.
CPC ...
G01R 1/04 (2006.01); G01R 1/067 (2006.01); G01R 1/073 (2006.01); G01R 1/36 (2006.01); G01R 31/00 (2006.01); G01R 35/00 (2006.01);
U.S. Cl.
CPC ...
G01R 1/0433 (2013.01);
Abstract

A testing device and probe elements thereof are provided. The testing device includes a circuit substrate, a plurality of probe elements, a first housing and a second housing. The plurality of probe elements are independent of each other and arranged at fixed intervals. Each probe element comprises a body, a first contact section and a second contact section. The body is provided with a plurality of strip-shaped perforations, and the body includes a first lateral side and a second lateral side opposite to each other. The first contact section is connected to the first lateral side, and the second contact section is connected to the second lateral side. The extension direction of the first contact section relative to the body and the extension direction of the second contact section relative to the body are distinct from each other.

Find Patent Forward Citations

Lou, Choon. (2023). Testing device and probe elements thereof (U.S. Patent No. 11768223). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11768223

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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