The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 26, 2023
Filed:
Feb. 28, 2023
Nanjing University of Aeronautics and Astronautics, Nanjing, CN;
Zhenghua Qian, Nanjing, CN;
Zhi Qian, Nanjing, CN;
Peng Li, Nanjing, CN;
Xianwei Wu, Nanjing, CN;
Chen Yang, Nanjing, CN;
Yinghong Zhang, Nanjing, CN;
NANJING UNIVERSITY OF AERONAUTICS AND ASTRONAUTICS, Nanjing, CN;
Abstract
The present disclosure relates to a method for ultrasonic guided wave quantitative imaging in a form of variable array and belongs to the technical field of ultrasonic non-destructive testing. The method includes: converting a non-linear lippmann-Schwinger equation into a form of linear summation by a method of moments; and selecting acquisition arrays with different numbers of probes to measure a scattered field signal, and modifying Green's functions by variable born approximation for continuous iterations to approximate a true solution, so as to obtain a final objective function Oto be solved. According to the present disclosure, by adjusting the arrays, the number of probes and appropriate solution algorithm can be selected based on the testing accuracy; and the method can achieve quantitative evaluation of non-destructive testing, and can be widely used in practical guided wave testing applications of industrial non-destructive testing.