The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 26, 2023
Filed:
Feb. 14, 2022
Applicant:
Shimadzu Corporation, Kyoto, JP;
Inventors:
Hideaki Katsu, Kyoto, JP;
Takashi Muramatsu, Kyoto, JP;
Hiromasa Maruno, Kyoto, JP;
Naoji Moriya, Kyoto, JP;
Assignee:
Shimadzu Corporation, Kyoto, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/35 (2014.01);
U.S. Cl.
CPC ...
G01N 21/35 (2013.01); G01N 2021/3595 (2013.01); G01N 2201/0633 (2013.01); G01N 2201/0636 (2013.01);
Abstract
A Fourier transform infrared spectrophotometer includes a main interfersometer, a control interferometer, an infrared detector, a control light detector, and a beam splitter block. The beam splitter block is disposed between a beam splitter and the control light detector. The control light detector has an optical axis inclined with respect to an optical axis of a control interference light beam.