The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 26, 2023
Filed:
Jan. 11, 2022
National University Corporation Tokai National Higher Education and Research System, Aichi, JP;
Mizuno Corporation, Osaka, JP;
Tetuya Mouri, Gifu, JP;
Tomoe Ozeki, Gifu, JP;
Yuki Yamada, Osaka, JP;
Kazuhiro Kume, Osaka, JP;
Akihiro Kanda, Osaka, JP;
Kazuyuki Takita, Gifu, JP;
Abstract
An object hardness measuring device includes a first side portion, a second side portion, a pedestal unit, a load unit, a measuring unit, and a holding unit. The load unit applies a load to the measurement object. The measuring unit is able to measure, in a state where the load acts on the measurement object, at least one of a movement distance of the second side portion with respect to the first side portion and a change amount of the load when the second side portion is moved either at a predetermined speed or to a predetermined position. The holding unit is able to hold the measurement object, and is movable between the first side portion and the second side portion by the slide rail unit.