The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 26, 2023
Filed:
Jan. 28, 2022
Institute of Geology and Geophysics, Chinese Academy of Sciences, Beijing, CN;
Renzhong Pei, Beijing, CN;
Zhongxing Wang, Beijing, CN;
Jiansheng Du, Beijing, CN;
Jian Zheng, Beijing, CN;
Xinzhen He, Beijing, CN;
Abstract
The present invention relates to alternating stress fatigue testing equipment. The alternating stress fatigue testing equipment includes a pedestal on which linear guide rails are arranged; a deflection loading device which is arranged on the pedestal and configured to, in response to a clamped to-be-measured object being driven to slide to a first position, enable the to-be-measured object to be bent to a target degree and keep the to-be-measured object after the to-be-measured object is bent to the target degree, wherein the deflection loading device is rotatably connected to the to-be-measured object; two hinged shaft supports which are arranged on the linear guide rails, wherein the hinged shaft supports are symmetrically arranged about a longitudinal center line of the deflection loading device, connected to both ends of the to-be-measured object respectively, and configured to be adjusted obliquely to adapt to the bending of the to-be-measured object to the target degree.