The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 26, 2023

Filed:

Nov. 09, 2021
Applicant:

Seiko Epson Corporation, Tokyo, JP;

Inventors:

Haruki Miyasaka, Matsumoto, JP;

Hisayuki Akahane, Matsumoto, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/02 (2006.01); G01J 3/50 (2006.01);
U.S. Cl.
CPC ...
G01J 3/0218 (2013.01); G01J 3/0264 (2013.01); G01J 3/50 (2013.01);
Abstract

A color measurement apparatus includes an opening portion forming member that is a member in which an opening portion for causing light arriving from a measurement target to enter inside the apparatus is formed, and that is arranged on a bottom surface at a time of measurement performed by the apparatus, the opening portion for causing the light arriving from the measurement target to enter inside the apparatus, an incident light processing portion that processes light incident through the opening portion, and an operation portion that is positioned on an upper surface, and that receives various operations, in which in a view from a first direction that is a vertical direction intersecting with the bottom surface and the upper surface which is the surface on the opposite side from the bottom surface and includes a display portion, the opening portion and the operation portion have an overlapping part.


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