The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 26, 2023
Filed:
Feb. 14, 2019
Applicant:
Regents of the University of Minnesota, Minneapolis, MN (US);
Inventors:
Daryl M. Gohl, Minneapolis, MN (US);
Kenneth B. Beckman, Minneapolis, MN (US);
Assignee:
REGENTS OF THE UNIVERSITY OF MINNESOTA, Minneapolis, MN (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C12P 19/34 (2006.01); C12Q 1/6869 (2018.01); C12N 15/10 (2006.01);
U.S. Cl.
CPC ...
C12Q 1/6869 (2013.01); C12N 15/1065 (2013.01);
Abstract
Provided herein are synthetic size standards that allow one to detect size bias in a sample that includes a plurality of polynucleotides. The size standards can provide an internal control to detect and correct for size bias in data obtained after manipulating and/or processing of sample polynucleotide. Also provided herein are methods for detecting size bias in a sample or in a sequencing run.
Gohl, Daryl. (2023). Size standards for next-generation sequencing (U.S. Patent No. 11767554). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11767554
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile