The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 26, 2023

Filed:

Oct. 13, 2021
Applicant:

Qiagen Gmbh, Hilden, DE;

Inventors:

Miroslav Vranes, Hilden, DE;

Ralf Peist, Hilden, DE;

Mario Scherer, Hilden, DE;

Stefan Otto Cornelius, Hilden, DE;

Assignee:

Qiagen, GmbH, Hilden, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C12Q 1/68 (2018.01); C12Q 1/6851 (2018.01); C12Q 1/6806 (2018.01);
U.S. Cl.
CPC ...
C12Q 1/6851 (2013.01); C12Q 1/6806 (2013.01); C12Q 2531/113 (2013.01); C12Q 2537/143 (2013.01); C12Q 2545/114 (2013.01);
Abstract

A kit for use in assessing the status of nucleic acid degradation and/or the integrity of one or more nucleic acids in a sample by amplifying at least two overlapping regions within at least one locus and detecting the amount of the at least two amplification products. The kit includes a primer and at least two probes that bind under stringent conditions to a sequence that shares at least 80% sequence identity to a sequence selected from the group of sequences consisting of SEQ ID NO. 6 to SEQ ID NO. 47 over a stretch of 80 base pairs, or to a reverse complement thereof. One of the at least two probes binds to one of the at least two overlapping regions and the other of the at least two probes binds to a non-overlapping region.


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