The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 26, 2023

Filed:

Oct. 21, 2020
Applicant:

Ford Global Technologies, Llc, Dearborn, MI (US);

Inventors:

Evangelos Liasi, Royal Oak, MI (US);

Liang Huang, Troy, MI (US);

Yinong Shen, Canton, MI (US);

Joon Kang, Troy, MI (US);

Rob Vaughn Degenhardt, Belleville, MI (US);

Assignee:

Ford Global Technologies, LLC, Dearborn, MI (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 30/20 (2020.01); B21D 53/88 (2006.01); G06F 30/23 (2020.01); G06F 113/24 (2020.01); B21D 22/00 (2006.01); G06F 111/00 (2020.01); G06F 30/25 (2020.01); G06F 30/28 (2020.01); G06F 30/27 (2020.01);
U.S. Cl.
CPC ...
B21D 53/88 (2013.01); B21D 22/00 (2013.01); G06F 30/20 (2020.01); G06F 30/23 (2020.01); G06F 30/25 (2020.01); G06F 30/27 (2020.01); G06F 30/28 (2020.01); G06F 2111/00 (2020.01); G06F 2113/24 (2020.01); Y10T 29/49758 (2015.01);
Abstract

A method of manufacturing a panel using an initial die and a series of secondary dies includes sequentially defining multi-dimensional models for the series of secondary dies. The method includes simulating a geometry of an npre-panel, defining a multi-dimensional model of the nsecondary die based on the simulated geometry of the npre-panel, simulating operation of the nsecondary die on the npre-panel to determine geometry of an (n+1)pre-panel, and determining a deviation between the simulated (n+1)pre-panel and a target pre-panel geometry. If the deviation is outside tolerance, the method includes iteratively: adjusting the multi-dimensional model of the nsecondary die, simulating operation thereof to determine an adjusted simulated geometry of the (n+1)pre-panel, and determining a deviation between the adjusted simulated geometry of the (n+1)pre-panel and the target (n+1)pre-panel, until the deviation is within the tolerance limit.


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