The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 26, 2023

Filed:

Dec. 19, 2022
Applicant:

Wuxi Marvel Stone Healthcare Co., Ltd., Wuxi, CN;

Inventors:

Ziyue Wu, Wuxi, CN;

Hai Luo, Chengdu, CN;

Weiqian Wang, Chengdu, CN;

Xiao Chen, Chengdu, CN;

Yang Ye, Wuxi, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 33/44 (2006.01); G01R 33/46 (2006.01); G01R 33/50 (2006.01); G01R 33/56 (2006.01); G01R 33/561 (2006.01); G01R 33/563 (2006.01); G01N 24/08 (2006.01); G01R 33/38 (2006.01); A61B 5/055 (2006.01);
U.S. Cl.
CPC ...
A61B 5/055 (2013.01); G01R 33/448 (2013.01); G01R 33/4625 (2013.01); G01R 33/50 (2013.01); G01N 24/08 (2013.01); G01R 33/3808 (2013.01); G01R 33/5608 (2013.01); G01R 33/5617 (2013.01); G01R 33/56341 (2013.01);
Abstract

A nuclear magnetic resonance (NMR) system-based substance measurement method, including: acquiring several echo signals of an NMR pulse sequence varying in echo spacing from a substance to be measured followed by processing to obtain several signals varying in transverse relaxation and diffusion attenuation; and fitting, in combination with the prior knowledge, the signals to obtain the diffusion coefficient, transverse relaxation time or/and content weight of individual components of the substance to be measured. This application further provides a substance measurement system including a console, a magnet module, and an NMR system.


Find Patent Forward Citations

Wu, Ziyue. (2023). Nuclear magnetic resonance system-based substance measurement method and system (U.S. Patent No. 11766189). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11766189

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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