The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 19, 2023
Filed:
Jun. 04, 2020
Qualcomm Incorporated, San Diego, CA (US);
Mingming Cai, San Jose, CA (US);
Raghu Narayan Challa, San Diego, CA (US);
Revathi Sundara Raghavan, San Diego, CA (US);
Michael Burke, Morris Plains, NJ (US);
Abhilash Bangalore Ravi, San Diego, CA (US);
Mihir Vijay Laghate, San Diego, CA (US);
Shrenik Patel, San Diego, CA (US);
Sang-June Park, San Diego, CA (US);
Mohammad Ali Tassoudji, San Diego, CA (US);
Sudarsan Krishnan, San Diego, CA (US);
Vasanthan Raghavan, West Windsor Township, NJ (US);
Siddharth Kamath, San Jose, CA (US);
QUALCOMM Incorporated, San Diego, CA (US);
Abstract
Various aspects of the present disclosure generally relate to wireless communication and testing. In some aspects, a device may receive information identifying a mount orientation of a wireless communication device, wherein the mount orientation indicates an orientation of a coordinate system of the wireless communication device relative to a coordinate system of a positioner. The device may capture measurement information at each position of a set of positions of the wireless communication device, wherein the set of positions comprises positions of the wireless communication device as the wireless communication device is rotated around an axis by the positioner, and wherein the measurement information is captured based at least in part on the mount orientation. The device may provide information identifying the measurement information. Some techniques and apparatuses described herein may use the measurement information to generate a codebook for beam generation. Numerous other aspects are provided.