The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 19, 2023

Filed:

Aug. 13, 2020
Applicant:

Qualcomm Incorporated, San Diego, CA (US);

Inventors:

Muhammad Nazmul Islam, Littleton, MA (US);

Awlok Singh Josan, San Francisco, CA (US);

Arash Mirbagheri, San Diego, CA (US);

Valentin Alexandru Gheorghiu, Yokohama, JP;

Assignee:

QUALCOMM Incorporated, San Diego, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 7/06 (2006.01); H04W 24/10 (2009.01); H04W 56/00 (2009.01); H04W 24/08 (2009.01); H04B 17/318 (2015.01); H04L 5/00 (2006.01); H04W 76/19 (2018.01); H04W 48/16 (2009.01);
U.S. Cl.
CPC ...
H04B 7/0695 (2013.01); H04B 7/0626 (2013.01); H04L 5/005 (2013.01); H04W 24/08 (2013.01); H04W 24/10 (2013.01); H04W 48/16 (2013.01); H04W 56/001 (2013.01); H04W 76/19 (2018.02);
Abstract

In an aspect, the present disclosure includes a method, apparatus, and computer readable medium for wireless communications for determining, by a user equipment (UE), an evaluation time period based on a number of a plurality of reference signals that are quasi-co-located (QCL) within one or more measurement windows; measuring, by the UE, a signal quality value of one or more of reference signals within the evaluation time period; and determining, by the UE, whether the signal quality value of one or more of reference signals within the evaluation time period crosses an evaluation threshold.


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