The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 19, 2023

Filed:

Sep. 20, 2021
Applicant:

Trumpf Lasersystems for Semiconductor Manufacturing Gmbh, Ditzingen, DE;

Inventor:

Jonathan Mueller, Stuttgart, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01S 3/13 (2006.01); H01S 3/10 (2006.01); H01S 3/00 (2006.01); H01S 3/106 (2006.01); H01S 3/16 (2006.01); H01S 3/223 (2006.01); H01S 3/225 (2006.01);
U.S. Cl.
CPC ...
H01S 3/10015 (2013.01); H01S 3/005 (2013.01); H01S 3/0071 (2013.01); H01S 3/106 (2013.01); H01S 3/10023 (2013.01); H01S 3/16 (2013.01); H01S 3/225 (2013.01); H01S 3/2232 (2013.01);
Abstract

A method for adjusting a laser beam includes, following passage of the laser beam through a beam-shaping device, measuring, via a detector of a detector device, a beam profile of the laser beam. The method further includes determining a beam quality property of the laser beam based on the measured beam profile and altering an adjustable optical unit for modifying at least one property of the laser beam prior to the entry into the beam-shaping device. For adjusting the laser beam, the adjustable optical unit is altered based on the determined beam quality property.


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